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Laser Elemental Analyzer model LEA-S500
The LEA-S500 is a Laser Induced Breakdown Spectrometer (Atomic Emission Spectroscopy) with bright analytical performance. The spectrometer combines the advantages of the recent developments in spectroscopy, laser technique and analytical Software. The LEA-S500 is a fully automated spectrometer permitting analysis of the composition of different solids, such as:
· Metals and alloys
· Ceramics
· Glass
· Plastics
· Trace elements in pure materials
· Compacted powder
The specially-designed laser as a spectrum excitation source allows one to analyze conducting/non-conducting materials, to considerably minimize the interaction between elements thus providing a generic calibration curve for a variety of element concentrations and also to eliminate the sample-preparation step.
By varying the laser pulse power, the area and depth of the damage surface one can analyze the composition and thickness of coating layers, thin films, impurities (trace elements, inclusions) and structural components.
The high-resolution spectrograph allows a high-quality aberration-free flat optical field to be obtained.
The multi-element spectrum detection system (2048 pixels CCD camera) ensures the fast data readout.
The triple (mechanical, electronic and Software) protection against laser irradiation provides the LEA-S500 safe operation.
· Ferrous and Nonferrous Metallurgy
· Mechanical Engineering
· Building Materials
· Extraction and Processing of Ore
· Geological Industry
· Semiconductor Industry
· Science of Materials
· Research in Universities and Laboratories
· Criminalistics
· Glass Industry
Table of guaranteed detection limits and concentration ranges for a number of elements in industrial iron, copper, aluminum and titanium bases alloys
Element
|
Detection Limits, 3s, ppm
|
Concentration ranges of elements in different-base alloys, %
|
Base-Iron
|
Base-Copper
|
Base-Aluminium
|
Base-Titanium
|
Min
|
Max
|
Min
|
Max
|
Min
|
Max
|
Min
|
Max
|
Be
|
0.1
|
|
|
0.0005
|
2.0
|
0.0005
|
2.0
|
|
|
B
|
1.2
|
0.005
|
0.2
|
|
|
|
|
|
|
C
|
10
|
0.05
|
4.5
|
|
|
|
|
|
|
Mg
|
0.5
|
0.001
|
0.15
|
|
|
0.01
|
5.0
|
|
|
Al
|
1.0
|
0.001
|
2.0
|
0.01
|
5.0
|
|
|
0.03
|
10.0
|
Si
|
5.0
|
0.005
|
20.0
|
0.01
|
5.0
|
0.01
|
17.0
|
0.06
|
0.7
|
P
|
10
|
0.01
|
0.5
|
0.05
|
2.0
|
|
|
|
|
Ti
|
0.3
|
0.001
|
10.0
|
|
|
0.01
|
2.0
|
|
|
V
|
2.0
|
0.005
|
10.0
|
|
|
|
|
0.05
|
7.0
|
Cr
|
2.0
|
0.005
|
30.0
|
0.01
|
1.5
|
0.01
|
0.5
|
0.05
|
3.0
|
Mn
|
0.5
|
0.003
|
18.0
|
0.003
|
7.0
|
0.01
|
2.0
|
0.01
|
3.0
|
Fe
|
1.0
|
|
|
0.01
|
15.0
|
0.005
|
2.0
|
0.01
|
2.0
|
Co
|
4.0
|
0.005
|
15.0
|
|
|
|
|
|
|
Ni
|
0.8
|
0.001
|
40.0
|
0.01
|
20.0
|
0.001
|
1.0
|
|
|
Cu
|
0.5
|
0.001
|
10.0
|
|
|
0.01
|
10.0
|
|
|
Zn
|
5.0
|
|
|
0.01
|
50.0
|
0.001
|
2.0
|
|
|
As
|
5.0
|
|
|
|
|
0.008
|
0.5
|
|
|
Zr
|
1.0
|
|
|
|
|
0.01
|
0.3
|
0.01
|
4.0
|
Nb
|
1.0
|
0.003
|
1.5
|
|
|
|
|
|
|
Mo
|
1.0
|
0.005
|
20.0
|
|
|
|
|
0.01
|
7.0
|
Cd
|
1.0
|
|
|
|
|
|
|
|
|
Sn
|
10.0
|
|
|
0.01
|
20.0
|
0.01
|
2.0
|
0.05
|
4.0
|
W
|
5.0
|
0.01
|
16.0
|
|
|
|
|
|
|
Pb
|
20.0
|
0.01
|
0.5
|
0.01
|
15.0
|
0.01
|
0.3
|
|
|
Bi
|
5.0
|
|
|
0.005
|
0.1
|
|
|
|
|
Ag
|
0.3
|
|
|
0.001
|
0.5
|
|
|
|
|
Sb
|
10.0
|
|
|
0.005
|
1.5
|
|
|
|
|
Na
|
0.1
|
|
|
|
|
0.001
|
1.0
|
|
|
Сa
|
1.0
|
|
|
|
|
|
|
|
|
Au
|
4.5
|
|
|
|
|
|
|
|
|
OPTICS Focal length, mm: *Grating, grooves/mm: *Wavelength range, nm: *Dispersion, nm/mm: *Wavelength resolution, nm:
|
500 1800 190-800 1.0 0.028
|
500 2400 190-600 0.7 0.020
|
500 3600 190-400 0.5 0.014
|
*Note: Any of the diffraction gratings can be used in the device according to the type of the materials the customer needs to analyze.
|
SAMPLE COMPARTMENT Sample size (without adapters): 12x12x2 mm (min), 75x75x40 mm (max) Availability of sample displacement along X-Y axes: +/- 5 mm (for averaging of measurement results) Analyzed zone size: DIA 0.03 - 1.7 mm Environment - Air Evacuation (optional) Adapters for wire, foil, small size samples
EXCITATION Original Q-switched Nd:YAG laser Average pulse energy: 100 mJ Energy stability: +/- 3% for 99% of pulses
DETECTION 2048 pixels linear CCD, 14 bit, USB-Interface (other detectors available) Full spectrum detection (Panorama)
MINIMUM SYSTEM REQUIREMENTS OS: Win 98/ME/2000/XP Processor: P-IV / 2GHz or similar RAM: 256 Mb HDD 40 Gb Graphic card: VIVO (Video-In, Video-Out), GeForce-3 (ASUSTeK) Monitor 17", min. screen resolution 1024x768, True Color CD-R Drive Two COM ports (interface RS-232); Port "Ethernet 100 Base-T" (connector RJ-45), USB ACCESSORIES: printer, speakers, add. port "Ethernet 100 Base-T" for internal network, CD-RW drive
SOFTWARE for Win 9x/2000/XP Automatic wavelengths calibration Indication of deviation from the specified type of material Control of unaccounted impurities Control of quality and reliability of analysis results Graphical representation of analytical signal Databases for: - CRM / RM / SUS - spectral lines - types of materials Printout and mathematical processing of analysis results
ANALYTICAL PROGRAMS Analytical programs (methodology) for analysis of: - alloys based on aluminium, nickel, copper, titanium etc. - any type steel and cast iron - conducting and non-conducting materials (plastics, ceramics, glass etc.) Qualitative, semiquantitative and quantitative analyses of different materials Automatic identification of material type or base element
ANALYSIS TIME 10 sec to 3 min in one point (depending on the quantity of elements to determine)
POWER REQUIREMENTS 230VAC, 50/60 Hz 900 W during measurement, 100 W stand-by
Overall Size (LxWxH): 550 x 750 x 1100 mm; Weight: 120 kg
For more details about Metalscan products contact us now.
Industrial Electronic & Services Joint Stock Company
355 Kim ma street, Ha noi, Viet nam
B11/217 La thanh Street, Ha noi, Viet nam
Tel: 844. 35146789
Fax: 844. 35148988
Mobile: +84-913 216191
E-mail:
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